Inspection device, inspection method, machine learning device, and machine learning method

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United States of America

PATENT NO 12094102
SERIAL NO

17518680

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Abstract

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The purpose of the present invention is to improve accuracy in inspection of an appearance of a mold. The inspection device includes at least one processor for performing an inspection step of inspecting an appearance of a mold using a learned model constructed by machine learning. Input into the learned model includes an inspection image obtained by imaging the appearance of the mold. Output from the learned model is information indicating an inspection result of the appearance of the mold.

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Patent Owner(s)

Patent OwnerAddress
SINTOKOGIO LTDJAPAN

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Sonohara, Takeshi Nagoya, JP 8 18
Sugino, Takehiro Nagoya, JP 21 9

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