Particle removing assembly and method of cleaning mask for lithography
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
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Sep 10, 2024
Grant Date -
Oct 5, 2023
app pub date -
May 23, 2023
filing date -
May 23, 2023
priority date (Note) -
In Force
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Abstract
A photolithographic apparatus includes a particle removing cassette, a pump and a compressor. The particle removing cassette includes a first slit that includes an array of parallel wind blade nozzles arranged along a length of the first slit, protruding from the first slit, and configured to eject and direct pressurized cleaning material to a patterning surface of a mask to remove debris particles on the patterning surface. The pump and the compressor are controlled by a controller to adjust a flow rate and a pressure of the pressurized cleaning material based on an amount of debris particles on the patterning surface of the mask.
First Claim
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Family

- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
Patent Owner | Address | |
---|---|---|
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD | HSINCHU |
International Classification(s)
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Chen, Chia-Jen | Jhudong Township, TW | 98 | 1413 |
# of filed Patents : 98 Total Citations : 1413 | |||
Lee, Hsin-Chang | Zhubei, TW | 203 | 1090 |
# of filed Patents : 203 Total Citations : 1090 | |||
Lin, Chen-Yang | Zhudong Township, TW | 17 | 187 |
# of filed Patents : 17 Total Citations : 187 | |||
Lin, Kuan-Wen | Taichung, TW | 23 | 45 |
# of filed Patents : 23 Total Citations : 45 | |||
Wang, Li-Hsin | Taipei, TW | 5 | 7 |
# of filed Patents : 5 Total Citations : 7 | |||
Yu, Da-Wei | Hsinchu, TW | 5 | 4 |
# of filed Patents : 5 Total Citations : 4 |
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