Abnormality detection apparatus for resolver

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United States of America Patent

PATENT NO 12085418
APP PUB NO 20230112554A1
SERIAL NO

17792288

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Abstract

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To provide an abnormality detection apparatus for resolver which can determine the abnormality of at least the first system, even if the period of the excitation AC voltage of the first system and the period of the excitation AC voltage of the second system are different periods, and the magnetic interference between systems occurs. An abnormality detection apparatus for resolver applies an AC voltage of a first period to a first system excitation winding; applies an AC voltage of a second period different from the first period to a second system excitation winding; calculates DC values of first system two output signals by performing a DC extraction processing; and determines abnormality of first system based on whether or not the DC values of first system two output signals are within a normal range.

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Patent Owner(s)

Patent OwnerAddress
MITSUBISHI ELECTRIC CORPORATIONCHIYODA-KU TOKYO 100-8310

International Classification(s)

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  • 2020 Application Filing Year
  • G01B Class
  • 1997 Applications Filed
  • 1356 Patents Issued To-Date
  • 67.91 % Issued To-Date
Click to zoom InYear of Issuance% of Matters IssuedCumulative IssuancesYearly Issuances2020202120222023202420250255075100

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ikeda, Hiroko Tokyo, JP 31 53
Ikeda, Kenji Tokyo, JP 173 1119
Kubo, Kenta Tokyo, JP 72 447
Matsunaga, Toshihiro Tokyo, JP 36 203
Mori, Tatsuya Tokyo, JP 169 677

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Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges225314501 - 100100200300400500600700800900100011001200130014001500160017001800190020002100220023002400

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