Microparticle measurement device, microparticle sorting device, microparticle measurement system, and microparticle sorting system

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United States of America Patent

PATENT NO 12078586
APP PUB NO 20220146403A1
SERIAL NO

17433740

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Abstract

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To provide a microparticle measurement technology capable of supporting excitation light in a wideband wavelength range.

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Patent Owner(s)

Patent OwnerAddress
SONY GROUP CORPORATION1-7-1 KONAN MINATO-KU TOKYO 1080075 ?1080075

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Okamoto, Yoshiki Tokyo, JP 81 480

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