Conductive particle-disposed film having conductive particles disposed within an elastomer film, method for producing the same, test probe unit, and continuity test method
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United States of America Patent
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Aug 20, 2024
Grant Date -
Sep 26, 2019
app pub date -
Nov 20, 2017
filing date -
Nov 30, 2016
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Abstract
A conductive particle-disposed film of the present invention useful for a test probe unit for a continuity test of a fine-pitch continuity test object such as a semiconductor device is configured so that conductive particles are disposed in the surface direction of the elastomer film. The thickness of the elastomer film approximately coincides with the average particle diameter of the conductive particles. Ends of the conductive particles are positioned in the vicinity of respective outermost faces of both surfaces of the elastomer film. The same or different conductive particle-disposed films may be layered. A pressure-sensitive adhesive layer may be formed on at least one surface of the conductive particle-disposed film.
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