Systems, devices, and methods for beam position monitoring and beam imaging
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United States of America Patent
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Aug 6, 2024
Grant Date -
Jun 3, 2021
app pub date -
Aug 28, 2020
filing date -
Aug 28, 2020
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Abstract
Embodiments of systems, devices, and methods relate to fast beam position monitoring for detecting beam misalignment in a beam line. In an example, a fast beam position monitor includes a plurality of electrodes extending into an interior of a component of a beam line. The fast beam position monitor is configured to detect a position of a beam passing through the component of the beam line based on beam halo current. Embodiments of systems, devices, and methods further relate to noninvasively monitoring parameters of beams advancing along a beam line. In examples, gas is puffed into a pumping chamber along a beam line. One or more beam parameters are measured from fluorescence resulting from collisions of energetic beam particulates of a beam advancing through the beam line.
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