Method for tuning work function using surface photo voltage and producing ultra-low-work-function surfaces, and devices operational therewith
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United States of America
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Jul 23, 2024
Grant Date -
N/A
app pub date -
Nov 30, 2021
filing date -
Nov 30, 2021
priority date (Note) -
In Force
status (Latency Note)
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Abstract
The embodiments provide a thermionic emission device and a method for tuning a work function in a thermionic emission device is provided. The method includes illuminating an N type semiconductor material of a first member of a thermionic emission device, wherein a work function of the N type semiconductor material is lowered by the illuminating. The method includes collecting, on one of the first member or a second member of the thermionic emission device, electrons emitted from one of the first member or the second member.
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International Classification(s)
- 2021 Application Filing Year
- H01J Class
- 2475 Applications Filed
- 1245 Patents Issued To-Date
- 50.31 % Issued To-Date
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- 0 Citation Count
- H01J Class
- 0 % this patent is cited more than
- 1 Age
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