Calibration data generation circuit and associated method
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United States of America Patent
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Jul 9, 2024
Grant Date -
Jul 27, 2023
app pub date -
Dec 21, 2022
filing date -
Jan 21, 2022
priority date (Note) -
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Abstract
The present application discloses a calibration data generation circuit and an associated method. The calibration data generation circuit includes: a first delay unit, having a first delay amount; and a first scan path, including: a first scan flip-flop, including: a scan data input terminal; a clock input terminal, arranged for receiving a clock signal; and an output terminal; and a second scan flip-flop, including: a scan data input terminal, coupled to the output terminal of the first scan flip-flop; a clock input terminal, arranged for receiving a delayed clock signal formed by the clock signal passing through the first delay unit; and an output terminal; wherein when the calibration data generation circuit operates, the first scan flip-flop and the second scan flip-flop are configured in a scan shift mode.
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