Semiconductor device and method for fabricating the same

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United States of America Patent

PATENT NO 12021134
APP PUB NO 20230097129A1
SERIAL NO

18073539

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Abstract

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A semiconductor device includes a gate structure on a substrate, a first spacer on a sidewall of the gate structure, a second spacer on a sidewall of the first spacer, a third spacer on a sidewall of the second spacer, and first and second stacks of an epitaxial layer and a cap layer respectively disposed at first and second sides of the gate structure. Preferably, a part of the second spacer comprises an I-shape, the cap layer includes a planar top surface and an inclined sidewall, the cap layer contacts the second spacer and the third spacer directly, and the cap layer includes a vertical sidewall connected to the inclined sidewall.

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Patent Owner(s)

Patent OwnerAddress
UNITED MICROELECTRONICS CORPNO 3 LI-HSIN ROAD 2 SCIENCE-BASED INDUSTRIAL PARK HSIN-CHU CITY

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Chao-Nan Tainan, TW 19 82
Chen, Chun-Jen Tainan, TW 140 458
Chen, Kuang-Hsiu Tainan, TW 31 44
Cheng, Yu-Lin Changhua County, TW 9 38
Chuang, Wei-Chih Tainan, TW 6 18
Huang, Chung-Ting Kaohsiung, TW 16 18
Huang, Jhong-Yi Nantou County, TW 7 8
Jiang, Bing-Yang Tainan, TW 4 6
Lin, Yu-Shu Tainan, TW 53 239
Liu, Chia-Jong Ping-Tung County, TW 26 170
Tang, Chi-Hsuan Kaohsiung, TW 13 16
Wang, Kai-Hsiang Taichung, TW 7 7
Wu, Guan-Ying Kaohsiung, TW 5 8

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