System and method for marking substrates within improved line recovery time
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United States of America Patent
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Jun 25, 2024
Grant Date -
Aug 18, 2022
app pub date -
Jun 12, 2020
filing date -
Jun 13, 2019
priority date (Note) -
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Abstract
A system having a plurality of marking and/or coding devices and a computing system coupled to the devices and having processor configured to: receive sensor data associated with each device; and store printer metadata and batch job metadata in a backup file for each device. The processor is configured to classify a fault condition of a respective one device based on one or more of received sensor data, device self-test data, current operational data and historical device condition data. The processor is configured to determine autonomously a repair process recommendation in response to the classified fault condition and based on an estimated time to repair (ETR) the device using a self-repair recovery process relative to a line recovery time (LRT) threshold. The processor is configured to recommend as the repair process recommendation the self-repair recovery process in response to the ETR being less than or equal to the LRT threshold.
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