Method of screening non-volatile memory cells
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United States of America Patent
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Jun 18, 2024
Grant Date -
Oct 19, 2023
app pub date -
Jul 6, 2022
filing date -
Apr 13, 2022
priority date (Note) -
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Abstract
A method for screening memory cells includes erasing the memory cells, weakly programming the memory cells to a modified erased state, performing a first read operation on the memory cells after the erasing and the weakly programming, screening any of the memory cells that exhibit a read current during the first read operation below a margin read current threshold M1, baking the memory cells after the first read operation, performing a second read operation on the memory cells after the baking, and screening any of the memory cells that exhibit a read current during the second read operation below the margin read current threshold M1.
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