Methods and systems for ascertaining factors contributing to the temperature of a device

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United States of America Patent

PATENT NO 11971698
APP PUB NO 20210240156A1
SERIAL NO

17248677

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Abstract

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Methods and systems for ascertaining factors contributing to the temperature of a device. A method includes monitoring a plurality of parameters that are contributing to a temperature of the device. The method also includes estimating a degree of contribution of internal factors to the temperature of the device based on the monitored plurality of parameters and a battery temperature of a battery of the device. The method further includes estimating a degree of contribution of external factors to the temperature of the device, based on the monitored plurality of parameters and a battery temperature of a battery of the device. A neural network can be used for estimating the temperature of the ambience of the device and the impacts of internal and external factors on temperature of the device.

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Patent Owner(s)

Patent OwnerAddress
SAMSUNG ELECTRONICS CO LTDSUWON KYUNGGI-DO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bang, Sungyong Suwon-si, KR 23 42
Chirayil, Sudheesh Babu Vaisakh Punnekkattu Bangalore, IN 2 0
Jacob, Jaitirth Anthony Bangalore, IN 3 0
Jaiswal, Aditi Bangalore, IN 1 0
Jha, Suraj Bangalore, IN 1 0
Jhawar, Aditya Bangalore, IN 4 0
Jung, Sunghun Suwon-si, KR 18 75
Kim, Hakryoul Suwon-si, KR 24 18
Kim, Jongwoo Suwon-si, KR 149 449
Nair, Renju Chirakarotu Bangalore, IN 12 15
Sahni, Nikhil Bangalore, IN 6 1

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