Probe head for a testing apparatus of electronic devices with enhanced filtering properties
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United States of America
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Apr 30, 2024
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N/A
app pub date -
Oct 15, 2021
filing date -
Oct 15, 2021
priority date (Note) -
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Abstract
A probe head comprises a plate-shaped support including respective pluralities of guide holes, a plurality of contact probes being slidingly housed in the respective pluralities of guide holes and including at least a first group of contact probes being apt to carry only one type of signal chosen between ground and power supply signals, a conductive portion realized on the support and including a plurality of the guide holes housing the contact probes of the first group, and at least one filtering capacitor having at least one capacitor plate being electrically connected to the conductive portion, the conductive portion electrically connecting the contact probes of the first group.
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