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United States of America Patent

PATENT NO 11970728
APP PUB NO 20210324440A1
SERIAL NO

17232480

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Abstract

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The present application discloses a method for rapidly identifying the resistance of wheat to black point disease caused by Bipolaris sorokiniana, where testing takes places in an indoor, controlled environment. The test method includes surface sterilization of wheat seeds, and cultivating wheat seedlings from the sterilized wheat seeds; preparing conidial suspension of Bipolaris sorokiniana, and spraying the conidial suspension on the seedlings at one-leaf-one-shoot stage; recording the percentage of the diseased leaf area in total leaf area of the first leaf of the wheat seedling on the 10th day of inoculation; calculating the black point incidence of the wheat according to an equation, and then evaluating the resistance of wheat to black point disease caused by Bipolaris sorokiniana through the black point incidence. Compared with existing field identification methods, the method of the present disclosure shortens identification time, simplifies identification procedure, greatly improves identification efficiency, and improves the accuracy and reliability of identification results.

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Patent Owner(s)

Patent OwnerAddress
HENAN AGRICULTURAL UNIVERSITY450000 NO 15 LONGZIHU UNIVERSITY PARK ZHENGDONG NEW AREA ZHENGZHOU CITY HENAN PROVINCE ZHENGZHOU CITY HENAN PROVINCE 450000

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Jiang, Yumei Zhengzhou, CN 1 0
Li, Haiyong Zhengzhou, CN 2 0
Li, Mengyu Zhengzhou, CN 7 0
Li, Qiaoyun Zhengzhou, CN 6 131
Niu, Jishan Zhengzhou, CN 1 0
Wang, Siyu Zhengzhou, CN 70 102
Xu, Kaige Zhengzhou, CN 1 0
Yin, Guihong Zhengzhou, CN 1 0

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