Combined TDECQ measurement and transmitter tuning using machine learning

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United States of America Patent

PATENT NO 11940889
APP PUB NO 20230050303A1
SERIAL NO

17877829

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Abstract

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A test and measurement system has a test and measurement instrument, a test automation platform, and one or more processors, the one or more processors configured to execute code that causes the one or more processors to receive a waveform created by operation of a device under test, generate one or more tensor arrays, apply machine learning to a first tensor array of the one or more tensor arrays to produce equalizer tap values, apply machine learning to a second tensor array of the one of the one or more tensor arrays to produce predicted tuning parameters for the device under test, use the equalizer tap values to produce a Transmitter and Dispersion Eye Closure Quaternary (TDECQ) value, and provide the TDECQ value and the predicted tuning parameters to the test automation platform. A method of testing devices under test includes receiving a waveform created by operation of a device under test, generating one or more tensor arrays, applying machine learning to a first tensor array of the one or more tensor arrays to produce equalizer tap values, applying machine learning to a second tensor array of the one or more tensor arrays to produce predicted tuning parameters for the device under test, using the equalizer tap values to produce a Transmitter Dispersion Eye Closure Quaternary (TDECQ) value, and providing the TDECQ value and the predicted tuning parameters to a test automation platform.

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Patent Owner(s)

Patent OwnerAddress
TEKTRONIX INC14150 SW KARL BRAUN DRIVE P O BOX 500 M/S 50-LAW BEAVERTON OR 97077

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Pickerd, John J Hillsboro, US 103 740
Tan, Kan Portland, US 84 455

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