Inspection apparatus and inspection method

Number of patents in Portfolio can not be more than 2000

United States of America

PATENT NO 11940394
APP PUB NO 20230349845A1
SERIAL NO

18350221

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

An inspection apparatus for inspecting an inspection target object, includes an X-ray generation tube having a target including an X-ray generation portion that generates X-rays by irradiation with an electron beam, and configured to emit X-rays to the inspection target object, and a plurality of X-ray detectors, wherein each of the plurality of X-ray detectors detects X-rays emitted from a foreign substance existing on an inspection target surface of the inspection target object irradiated with the X-rays from the X-ray generation portion and totally reflected by the inspection target surface.

First Claim

See full text

loading....

Other Claims data not available

Family

Loading Family data... loading....

Patent Owner(s)

  • CANON ANELVA CORPORATION

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Tsukamoto, Takeo Niigata, JP 217 3544

Cited Art Landscape

Load Citation

Patent Citation Ranking

  • 0 Citation Count
  • H01J Class
  • 0 % this patent is cited more than
  • 1 Age
Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges397216101 - 10025050075010001250150017502000225025002750300032503500375040004250

Forward Cite Landscape

Load Citation

Maintenance Fees

Fee Large entity fee small entity fee micro entity fee due date
3.5 Year Payment $1600.00 $800.00 $400.00 Sep 26, 2027
7.5 Year Payment $3600.00 $1800.00 $900.00 Sep 26, 2031
11.5 Year Payment $7400.00 $3700.00 $1850.00 Sep 26, 2035