Mask fingerprint using mask sensitive circuit

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United States of America Patent

PATENT NO 11934094
APP PUB NO 20220308441A1
SERIAL NO

17301032

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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According to a first aspect of the present invention, there is provided a method, a computer system and a computer program product. The method, computer system and computer program product including measuring an initial state of a set of SRAM bits on the wafer, identifying a first set of signature SRAM bits on the wafer, of the set of SRAM bits on the wafer, where the first set of SRAM bits comprise a consistent initial state greater than a first threshold percentage of times, measuring physically dimensions of features of the first set of SRAM bits on the wafer; and identifying a set of signature SRAM bits of the first set of SRAM bits on the wafer, wherein the set of signature SRAM bits comprise physical dimensions of features which correlate to the initial state of each correlated SRAM bit.

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Patent Owner(s)

Patent OwnerAddress
INTERNATIONAL BUSINESS MACHINES CORPORATIONNEW ORCHARD ROAD ARMONK NY 10504

International Classification(s)

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  • 2021 Application Filing Year
  • G01N Class
  • 11893 Applications Filed
  • 4411 Patents Issued To-Date
  • 37.09 % Issued To-Date
Click to zoom InYear of Issuance% of Matters IssuedCumulative IssuancesYearly Issuances202120222023202420250255075100

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Leobandung, Effendi Stormville, US 541 5177
Wu, Stephen Poughkeepsie, US 123 1574

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Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges1160734601 - 100500100015002000250030003500400045005000550060006500700075008000850090009500100001050011000115001200012500

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