Method of determining the three-dimensional structure of molecules in crystalline inclusion complexes
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United States of America Patent
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Mar 19, 2024
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Nov 24, 2022
app pub date -
Oct 6, 2020
filing date -
Oct 6, 2020
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Abstract
The invention is directed to a method for elucidating the three-dimensional structure of compounds by X-ray diffraction (X-ray SCD) characterized in that the compound is co-analyte crystallized with tetraaryladamantanes according to general formula I Wherein R and R′ are identical or different residues selected from the group consisting of O—R1, S—R1, NHR1, NR1R2, F, Cl, Br or I and R1, R2 stand for identical or different, substituted on not substituted aliphatic or aromatic residues having 1 to 25 carbon atoms and the the three-dimensional structure of the compound is obtained by X-ray diffraction (X-ray SCD).
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