Calibration object for an X-ray system

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United States of America Patent

PATENT NO 11911206
APP PUB NO 20210315537A1
SERIAL NO

17270152

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Abstract

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Disclosed is a calibration object for an x-ray system and an optical system, the calibration object comprising: a first part made of a first material having a matte surface, the first material having a first attenuation coefficient of x-rays; a second part made of a second material having a second attenuation coefficient of x-rays different from the attenuation coefficient of the first material; wherein the first part is attached to the second part so that one or more features are detectable by one or more optical cameras.

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Patent Owner(s)

Patent OwnerAddress
NEWTON2 APSHERLEV

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Esbech, Bo Værløse, DK 14 129

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