System and method for selecting a quality grade metric profile for assuring optimal control of symbol quality in a DPM process
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United States of America Patent
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Feb 20, 2024
Grant Date -
Mar 4, 2021
app pub date -
Dec 20, 2018
filing date -
Dec 28, 2017
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Abstract
A computer-implemented system and process of producing a metric quality grade profile for use during inspection of DPM symbol marked on parts may include storing average metrics measured in a controlled environment for a “golden” sample. Measurements of the DPM symbol of the “golden” sample may be performed. Measurements of the metrics of the “golden” sample in an uncontrolled environment may be performed. Average metrics from the uncontrolled environment may be calculated. The averaged metrics from the controlled and uncontrolled environment may be compared. The user may be enabled to set an acceptable grade for the individual metrics. The acceptable grades for the individual metrics as a profile of the DPM symbol in memory.
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