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• 15 United States
• 10 France
• 8 Japan
• 7 China
• 5 Korea
• 2 Other

Patent Owner(s)

Patent Owner	Address
ATTOCUBE SYSTEMS AG	EGLFINGER WEG 2 HAAR 85540

International Classification(s)

• G01Q:SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIO....

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Inventor(s)

Inventor Name	Address	# of filed Patents	Total Citations
Diem, Marcus	Haar, DE	2	0
Govyadinov, Alexander A	Haar, DE	4	25
Huth, Florian	Haar, DE	16	19
Malovichko, Ivan	Haar, DE	2	0

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Maintenance Fees

Fee	Large entity fee	small entity fee	micro entity fee	due date
3.5 Year Payment	$1600.00	$800.00	$400.00	Aug 13, 2027
7.5 Year Payment	$3600.00	$1800.00	$900.00	Aug 13, 2031
11.5 Year Payment	$7400.00	$3700.00	$1850.00	Aug 13, 2035

Fee	Large entity fee	small entity fee	micro entity fee
Surcharge - 3.5 year - Late payment within 6 months	$160.00	$80.00	$40.00
Surcharge - 7.5 year - Late payment within 6 months	$160.00	$80.00	$40.00
Surcharge - 11.5 year - Late payment within 6 months	$160.00	$80.00	$40.00
Surcharge after expiration - Late payment is unavoidable	$700.00	$350.00	$175.00
Surcharge after expiration - Late payment is unintentional	$1,640.00	$820.00	$410.00

DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
February 13, 2024	US,11899041,B2   US11899041B2	GRANTED PATENT AS SECOND PUBLICATION
September 07, 2023	US,20230280369,A1   US20230280369A1	FIRST PUBLISHED PATENT APPLICATION

Full Text

US Patent Application No: 11899041

Method for referencing a near-field measurement with drift and fluctuation correction

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