Probe head and probe card having same

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 11852656
APP PUB NO 20210302472A1
SERIAL NO

17214785

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Abstract

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Proposed is a probe head having a probe card for performing a circuit inspection of a wafer. More particularly, proposed are a probe head and a probe card having the probe head, the probe head having a guide plate. The guide plate has a guide hole and a shield portion composed of a metal material positioned at the periphery of the guide hole, thereby blocking signal interference that may be occurred between adjacent probes.

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Patent Owner(s)

Patent OwnerAddress
POINT ENGINEERING CO LTD89 ASANVALLEY-RO DUNPO-MYEON ASAN-SI CHUNGCHEONGNAM-DO 31409 31409

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ahn, Bum Mo Suwon-si, KR 162 241
Park, Seung Ho Hwaseong-si, KR 185 355
Song, Tae Hwan Cheonan-si, KR 41 44

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