Fountain solution thickness measurement system and method using ellipsometry
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United States of America Patent
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Dec 5, 2023
Grant Date -
Dec 29, 2022
app pub date -
Jun 23, 2021
filing date -
Jun 23, 2021
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Abstract
An optical light reflectance measurement system above an imaging member surface measures fountain solution surface light reflectance interference on reflective substrate portions of the imaging member surface in real-time during a printing operation. The measured light reflectance interference corresponds to a thickness of the fountain solution layer and may be used in a feedback loop to actively control fountain solution layer thickness by adjusting the volumetric feed rate of fountain solution added onto the imaging member surface during a printing operation to reach a desired uniform thickness for the printing. This fountain solution monitoring system may be fully automated.
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