Geometrically and spectrally resolved albedometers for bifacial modules

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United States of America Patent

PATENT NO 11835385
APP PUB NO 20230125617A1
SERIAL NO

17760493

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Abstract

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The present invention is in the field of a geometrically and spectrally resolved albedometer for a PV-module, a method of determining characteristics of reflected light, a method of optimizing reflected light performance of a solar cell, and a computer program for geometrically and spectrally resolving light.

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Patent Owner(s)

Patent OwnerAddress
TECHNISCHE UNIVERSITEIT DELFTSTEVINWEG 1 DELFT 2628 CN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Heirman, Stefaan Gustaaf Mariette Delft, NL 1 0
Isabella, Olindo Delft, NL 5 0
Pandraud, Gregory Delft, NL 4 5
Zeman, Miroslav Delft, NL 6 20
Ziar, Hesan Delft, NL 2 0

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