Semiconductor device performing loop-back test operation
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United States of America Patent
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Nov 28, 2023
Grant Date -
Aug 18, 2022
app pub date -
May 4, 2022
filing date -
Nov 25, 2020
priority date (Note) -
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Abstract
Disclosed herein is an apparatus that includes a memory cell array; a data input/output terminal; a read data path and a write data path coupled in parallel between the memory cell array and the data input/output terminal, wherein the read data path includes a pre-driver and an output driver coupled in series, and wherein the write data path includes an input receiver and a latch circuit coupled in series; and a test path configured to provide a shortcut between the pre-driver in the read data path and the latch circuit in the write data path.
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