Substrate-free 2D tellurene

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United States of America Patent

PATENT NO 11827515
APP PUB NO 20230002228A1
SERIAL NO

17941824

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Abstract

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The present disclosure generally relates to compositions comprising substrate-free 2D tellurene crystals, and the method of making and using the substrate-free 2D tellurene crystals. The 2D tellurene crystals of the present disclosure are characterized by an X-ray diffraction pattern (CuKα radiation, λ=1.54056 A) comprising a peak at 23.79 (2θ±0.1°) and optionally one or more peaks selected from the group consisting of 41.26, 47.79, 50.41, and 64.43 (2θ±0.1°).

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Patent Owner(s)

Patent OwnerAddress
PURDUE RESEARCH FOUNDATIONINDIANA USA INDIANA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Wang, Yixiu West Lafayette, US 10 8
Wu, Wenzhuo West Lafayette, US 19 60

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