Method for processing workpiece

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 11823903
SERIAL NO

17560245

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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According to an embodiment, a wafer (W) includes a layer (EL) to be etched, an organic film (OL), an antireflection film (AL), and a mask (MK1), and a method (MT) according to an embodiment includes a step of performing an etching process on the antireflection film (AL) by using the mask (MK1) with plasma generated in a processing container (12), in the processing container (12) of a plasma processing apparatus (10) in which the wafer (W) is accommodated, and the step includes steps ST3a to ST4 of conformally forming a protective film (SX) on the surface of the mask (MK1), and steps ST6a to ST7 of etching the antireflection film (AL) by removing the antireflection film (AL) for each atomic layer by using the mask (MK1) on which the protective film (SX) is formed.

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Patent Owner(s)

Patent OwnerAddress
TOKYO ELECTRON LIMITEDTOKYO 107-6325

International Classification(s)

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  • 2021 Application Filing Year
  • H01J Class
  • 2475 Applications Filed
  • 1245 Patents Issued To-Date
  • 50.31 % Issued To-Date
Click to zoom InYear of Issuance% of Matters IssuedCumulative IssuancesYearly Issuances202120222023202420250255075100

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hisamatsu, Toru Miyagi, JP 51 84
Kihara, Yoshihide Miyagi, JP 103 190
Oishi, Tomoyuki Miyagi, JP 10 18

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Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges3687790501 - 1011 - 2001000200030004000250500750125015001750225025002750325035003750

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