Optical three-dimensional scanning for collision avoidance in microscopy system

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United States of America Patent

PATENT NO 11821860
SERIAL NO

17070497

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Abstract

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A collision avoidance system and method for an x-ray CT microscope processes image data of an object at different angles and generates a model of the object. This model is then used to configure the microscope for operation and possibly avoid collisions between the microscope and the object.

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Patent Owner(s)

Patent OwnerAddress
CARL ZEISS X-RAY MICROSCOPY INC5300 CENTRAL PARKWAY DUBLIN CA 94568

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chang, Hauyee Pleasanton, US 5 84
Omlor, Lars Pleasanton, US 23 88

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