Manganese or scandium doped multi-element non-linear polar material gain memory bit-cell

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United States of America Patent

PATENT NO 11810608
SERIAL NO

18061270

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Abstract

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A high-density low voltage ferroelectric (or paraelectric) memory bit-cell that includes a planar ferroelectric or paraelectric capacitor. The memory bit-cell comprises 1T1C configuration, where a plate-line is parallel to a word-line, or the plate-line is parallel to a bit-line. The memory bit-cell can be 1TnC, where ‘n’ is a number. In a 1TnC bit-cell, the capacitors are vertically stacked allowing for multiple values to be stored in a single bit-cell. The memory bit-cell can be multi-element FE gain bit-cell. In a multi-element FE gain bit-cell, data sensing is done with signal amplified by a gain transistor in the bit-cell. As such, higher storage density is realized using multi-element FE gain bit-cells. In some examples, the 1T1C, 1TnC, and multi-element FE gain bit-cells are multi-level bit-cells. To realize multi-level bit-cells, the capacitor is placed in a partially switched polarization state by applying different voltage levels or different time pulse widths at the same voltage level.

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KEPLER COMPUTING INCPO BOX 192524 SAN FRANCISCO CA 94119

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Dokania, Rajeev Kumar Beaverton, US 215 1136
Gosavi, Tanay Portland, US 149 522
Manipatruni, Sasikanth Portland, US 400 3194
Mathuriya, Amrita Portland, US 239 1338
Olaosebikan, Debo San Francisco, US 52 149
Pandey, Pratyush Kensington, US 23 56
Sato, Noriyuki Hillsboro, US 188 791

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