Built-in self-test circuit and built-in self-test method for physical unclonable function quality check
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United States of America Patent
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Oct 10, 2023
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N/A
app pub date -
Aug 26, 2021
filing date -
Dec 11, 2020
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Abstract
A built-in self-test (BIST) circuit and a BIST method for Physical Unclonable Function (PUF) quality check are provided. The BIST circuit may include a PUF array, a readout circuit coupled to the PUF array, and a first comparing circuit coupled to the readout circuit. The PUF array may include a plurality of PUF units, wherein each of the PUF units includes a first cell and a second cell. The readout circuit may be configured to output an output bit from the first cell and output a parity bit from the second cell. The first comparing circuit may be configured to compare an output string with a parity string to generate a parity check result, wherein the output string includes output bits respectively read from selected PUF units of the PUF units, and the parity string includes parity bits read from the selected PUF units.
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