Processing system, measuring probe, shape measuring device, and program
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United States of America Patent
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Sep 26, 2023
Grant Date -
Mar 11, 2021
app pub date -
Dec 25, 2017
filing date -
Dec 25, 2017
priority date (Note) -
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status (Latency Note)
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Abstract
A processing system includes a control unit that generates positional information related to a position of a measuring unit at a time of measuring a processing object and outputs the generated positional information and a generation period signal indicating a period during which the positional information is generated, an acquisition unit that acquires the positional information and the generation period signal which have been output, an acquisition interval calculation unit that calculates a statistical value indicating an interval between acquisition periods regarding a plurality of generation period signals acquired by the acquisition unit, an estimation unit that estimates the period during which the positional information is generated on the basis of the statistical value calculated by the acquisition interval calculation unit, and a shape calculation unit that calculates a shape of the processing object based on measurement information, the positional information, and the period estimated by the estimation unit.
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