Method and apparatus for identifying sample position in atomic force microscope
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United States of America Patent
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Sep 19, 2023
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app pub date -
Dec 24, 2021
filing date -
Dec 31, 2020
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Abstract
An apparatus and a method for identifying a sample position in an atomic force microscope according to an exemplary embodiment of the present disclosure are provided. The method for identifying a sample position in an atomic force microscope includes receiving a vision image including a subject sample through a vision unit; determining a subject sample region in the vision image using a prediction model which is configured to output the subject sample region by receiving the vision image as an input; and determining a position of the subject sample based on the subject sample region.
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