Method of analyzing samples, analyzing device and computer program
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United States of America Patent
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Aug 8, 2023
Grant Date -
May 20, 2021
app pub date -
Jun 27, 2018
filing date -
Jun 27, 2017
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Abstract
The method of analyzing one or more samples arranged in sample receptacles of a platform that is configured to receive a plurality of separate samples includes the steps of measuring electromagnetic radiation transmitted or emitted by each sample, repeating the measurement a plurality of times at predetermined intervals, on the basis of each measurement, forming a result matrix comprising a plurality of cells, each cell of the result matrix corresponding to a sample receptacle of the plat-form, wherein a measurement value of each sample is used as an input for determining the visual properties of the respective cell in the result matrix, and displaying the results as consecutive matrixes in respect of time.
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