Measurement method, measurement device, measurement system, and measurement program
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United States of America Patent
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Aug 1, 2023
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app pub date -
Mar 17, 2021
filing date -
Mar 18, 2020
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Abstract
A measurement method includes: a step of acquiring first observation point information including a time point when each part of an m-th moving object passes a first observation point and a physical quantity which is a response to an action; a step of acquiring second observation point information including a time point when the each part passes a second observation point and a physical quantity which is a response to an action; a step of calculating a deflection waveform of a structure generated by the each part; a step of adding the deflection waveforms to calculate an m-th moving object deflection waveform; a step of calculating a displacement waveform at the third observation point; and a step of calculating first to M-th amplitude coefficients by assuming that a waveform obtained by multiplying an m-th amplitude coefficient by the m-th moving object deflection waveform is an m-th amplitude adjusted deflection waveform, and that a sum of first to M-th amplitude adjusted deflection waveforms is approximated to the displacement waveform.
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