Conductive particle and testing socket comprising the same

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United States of America Patent

PATENT NO 11693027
SERIAL NO

17340841

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Abstract

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An embodiment of the present invention provides a conductive particle used for a testing socket electrically connecting a lead of a device to be tested and a pad of a test board by being arranged between the device to be tested and the test board, wherein the conductive particle comprises a plurality of protrusions formed at equal intervals along a circumference.

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Patent Owner(s)

Patent OwnerAddress
SNOW CO LTD#509 5F 219 GYEONGGIGWAGIDAE-RO SIHEUNG-SI GYEONGGI-DO 15079

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kim, Gyu Sun Yongin-si, KR 17 9

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