Method and apparatus for demolding and analyzing a direct analysis sample

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United States of America Patent

PATENT NO 11662277
APP PUB NO 20200256768A1
SERIAL NO

16776219

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Abstract

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The present invention relates to an apparatus for demolding and analyzing a direct analysis sample formed from a molten metal material contained within a sample chamber assembly, wherein the sample chamber assembly comprises at least a sample housing, a cover plate and closing means, comprising:

    a cabinet defining an interior and comprising at least one opening for the sample housing to enter the cabinet, and analyzing means located inside the cabinet for analyzing an analysis surface of the sample;demolding means adapted to remove at least the closing means to expose at least part of the analysis surface of the sample; andtransporting means adapted to hold and transport the sample housing at least between a sample demolding position, where the closing means is removed by the demolding means, and a sample analysis position, where the analysis surface of the sample is analyzed by the analyzing means, and wherein the sample demolding position and the sample analysis position are different from each other.

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Patent Owner(s)

Patent OwnerAddress
HERAEUS ELECTRO-NITE INTERNATIONAL N V3530 HOUTHALEN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Cuypers, Jan Houthalen, BE 9 77
Verhoeven, Jean-Paul Houthalen, BE 6 10

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