Method and apparatus for measuring tear film thickness using optical interference

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United States of America Patent

PATENT NO 11614321
APP PUB NO 20200309510A1
SERIAL NO

16829673

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Abstract

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An interferometric method of identifying the thickness of an object that is too thin to be resolved by a Fourier transform of the interference signal includes applying a harmonic frequency modulation to an envelope of the interference signal. Where the object is a tear film, this method may be utilized to determine a thickness of the lipid layer of the tear film.

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Patent Owner(s)

Patent OwnerAddress
TOPCON CORPORATION75-1 HASUNUMA-CHO ITABASHI-KU TOKYO 1748580

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Cao, Bin Wayne, US 259 1167
Chan, Kinpui Ridgewood, US 47 594
Kim, Jongsik Fort Lee, US 57 139
Mao, Zaixing Edgewater, US 25 56
Mei, Song Franklin Park, US 78 1860
Wang, Zhenguo Ridgewood, US 64 238

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