Truncated non-linear interferometer-based sensor system
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United States of America Patent
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Jan 24, 2023
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N/A
app pub date -
Sep 10, 2021
filing date -
Dec 18, 2019
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Abstract
A truncated non-linear interferometer-based sensor system includes an input that receives an optical beam and a non-linear amplifier that generates a probe beam and a conjugate beam from the optical beam. The system's local oscillators are related to the probe beam and the conjugate beam. The system includes a sensor that transduces an input with the probe beam and the conjugate beam. The transduction detects changes in the phase of each of the probe beam and the conjugate beam. The system's phase sensitive detectors detect phase modulations between the respective local oscillators, the probe beam, and the conjugate beam and outputs phase signals based on detected phase modulations. The system measures phase signals indicative of the sensor's input resulting from a sum or difference of the phase signals. The measurement exhibits a quantum noise reduction in an intensity difference, a phase sum, or an amplitude difference quadrature.
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- B82Y:SPECIFIC USES OR APPLICATIONS OF NANO-STRUCTURES; ....
- G01N:INVESTIGATING OR ANALYSING MATERIALS BY DETERMININ....
- G01Q:SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIO....
- G01B:MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIME....
- H01S:DEVICES USING STIMULATED EMISSION
- G02F:DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF ....
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