Method and system for fault verification of electronic device
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United States of America Patent
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Dec 27, 2022
Grant Date -
Jul 23, 2020
app pub date -
Apr 7, 2020
filing date -
Nov 14, 2018
priority date (Note) -
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Abstract
A method and a system for fault verification of an electronic device are provided. The electronic device includes a device to-be-verified. The method includes the following. A first power-supply voltage is applied to the electronic device until the device to-be-verified satisfies a material-failure condition. A second power-supply voltage is applied to the electronic device to determine whether the electronic device has safety risk. The first power-supply voltage is higher than the second power-supply voltage, and the safety risk is caused by material failure in the device to-be-verified. The method and the system for fault verification of an electronic device can verify safety risk caused by material failure in internal components of the electronic device.
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