Automated test equipment for testing one or more devices-under-test and method for operating an automated test equipment
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United States of America Patent
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Nov 15, 2022
Grant Date -
Jun 24, 2021
app pub date -
Oct 30, 2020
filing date -
Dec 18, 2019
priority date (Note) -
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status (Latency Note)
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Abstract
An automated test equipment for testing one or more DUTs comprises a test head and a DUT interface. The DUT interface comprises a plurality of blocks of spring-loaded pins, for example groups or fields of spring-loaded pins. For example, the DUT interface is configured for establishing an electronic signal path between the test head and a DUT board or load board, which holds the DUT or which provides a connection to the DUT. The automated test equipment is configured to allow for a variation of a distance between at least two blocks of spring-loaded pins.
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