Atomic force microscope probes and methods of manufacturing probes
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Nov 15, 2022
Grant Date -
Apr 23, 2020
app pub date -
Nov 30, 2019
filing date -
May 30, 2017
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
Articles and methods related to scanning probe microscopy probes are generally provided. A scanning probe microscopy probe may comprise a chip, a mechanical resonator attached to the chip, a tip attached to the mechanical resonator, and a handle attached to the chip. The handle may have a length of at least 5 mm and an average thickness of less than or equal to 500 microns. The probe may further comprise an insulating coating covering both the chip and the handle.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully