Surveying instrument and method of calibrating a survey instrument
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United States of America Patent
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Nov 8, 2022
Grant Date -
Aug 20, 2020
app pub date -
Oct 14, 2019
filing date -
Feb 15, 2019
priority date (Note) -
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status (Latency Note)
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Abstract
A surveying instrument comprises a base; an alidade rotatable about a first axis relative to the base; and an optical measuring instrument having a measuring axis rotatable about a second axis relative to the alidade. A beam path can be provided for a light beam using components including a light source, lenses, mirrors, beam splitters, and a position-sensitive detector. The surveying can be calibrated by performing plural measurements at different orientations of the alidade relative to the base and different orientations of the measuring instrument relative to the alidade using the above components.
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