X-ray inspection apparatus and deterioration determination method for X-ray inspection apparatus
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United States of America Patent
Stats
-
Nov 1, 2022
Grant Date -
May 12, 2022
app pub date -
Jul 1, 2021
filing date -
Nov 9, 2020
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
Provided is an X-ray inspection apparatus including: an X-ray tube configured to generate X-rays; a high-voltage power source configured to supply a tube voltage to the X-ray tube to generate X-rays; an X-ray irradiation control section configured to output a first control signal and a second control signal to the high-voltage power source to control the high-voltage power source; and a determination section configured to count at least one of the first control signal and the second control signal output from the X-ray irradiation control section to the high-voltage power source, compare a counted count value with a preset threshold value, and determine a deterioration state of a component constituting the X-ray tube.
First Claim
Other Claims data not available
Family
International Classification(s)
- 2021 Application Filing Year
- H01J Class
- 2475 Applications Filed
- 1245 Patents Issued To-Date
- 50.31 % Issued To-Date
Cited Art Landscape
Patent Citation Ranking
- 0 Citation Count
- H01J Class
- 0 % this patent is cited more than
- 3 Age
Maintenance Fees
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