Semiconductor structure formation

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United States of America Patent

PATENT NO 11469103
APP PUB NO 20210143011A1
SERIAL NO

17153997

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Abstract

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Methods, apparatuses, and systems related to semiconductor structure formation are described. An example method includes forming an opening through silicon (Si) material, formed over a semiconductor substrate, to a first depth to form pillars of Si material. The example method further includes depositing an isolation material within the opening to fill the opening between the Si pillars. The example method further includes removing a portion of the isolation material from between the pillars to a second depth to create a second opening between the pillars and defining inner sidewalls between the pillars. The example method further includes depositing an enhancer material over a top surface of the pillars and along the inner sidewalls of the pillars down to a top portion of the isolation material.

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Patent Owner(s)

Patent OwnerAddress
MICRON TECHNOLOGY INC8000 S FEDERAL WAY P O BOX 6 BOISE ID 83707-0006

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hu, Shen Boise, US 13 18
Khandekar, Anish A Boise, US 42 222
Sapra, Sanjeev Boise, US 36 189
Tapias, Nicholas R Boise, US 12 25

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