Method of observing objects using a spinning localized observation
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United States of America Patent
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Oct 4, 2022
Grant Date -
N/A
app pub date -
Aug 29, 2019
filing date -
Sep 1, 2018
priority date (Note) -
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status (Latency Note)
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Abstract
An efficient method of scanning is provided that may be used for treatment, analysis, inspection and testing physical objects and spaces. High precision, resolution and throughput of scanning are achieved by employing a dual motion of probing devices and scanned objects. A probing device spins with high speed about an axis of spinning directed towards a scanned object. Concurrently, the spinning axis is set in a relatively slow motion with respect to the scanned object. Both the spinning of the probing and the motion of the spin axis are implemented in a controlled and predetermined way to achieve objectives of scanning. Accordingly, arbitrary large and shaped objects may be efficiently scanned with high precision and throughput.
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International Classification(s)
- G01N:INVESTIGATING OR ANALYSING MATERIALS BY DETERMININ....
- G06F:ELECTRIC DIGITAL DATA PROCESSING
- G01Q:SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIO....
- G02B:OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G01R:MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC V....
- G01B:MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIME....
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