Sealability evaluation method and the like and standard artificial leak device

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 11408795
APP PUB NO 20210080341A1
SERIAL NO

17050246

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Abstract

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It is an object of the present invention to enhance reliability of an allowable limit conductance used for setting a threshold value for evaluating sealability of a test object, and further, enhance reliability of the sealability evaluation. By leak testing a test object 9A with a sealing defect 9g, a leakage characteristic that shows a relationship between an internal-external pressure difference and a leak flow rate is obtained. A conductance of a test object with a similar artificial leak 9B having a similar artificial leak device 29 disposed therein, conducting the leak-detected substance is measured. The similar artificial leak device 29 has a leakage characteristic similar to the obtained leakage characteristic. An allowable limit conductance is obtained based on results of the measurement. Sealability of a test object 9 is evaluated based on a threshold value set with a standard artificial leak device 9S having the allowable limit conductance.

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Patent Owner(s)

Patent OwnerAddress
FUKUDA CO LTD16-5 NUKUI 3-CHOME NERIMA-KU TOKYO 1760021

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Higuchi, Yasuhiko Tokyo, JP 1 1
Hirata, Mao Tokyo, JP 6 2
Ito, Masakazu Tokyo, JP 45 246
Matsui, Yuho Tokyo, JP 1 1

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