Measurement method and measurement apparatus

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United States of America Patent

PATENT NO 11386570
APP PUB NO 20200286249A1
SERIAL NO

16795670

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Abstract

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According to one embodiment, a measurement method includes: acquiring a first picture including a background image and a substance, the substance allowing transmission of light from the background image; acquiring a second picture including the background image and the substance in a different positional relation with respect to the first picture; and calculating a first displacement amount representing a difference in position of the background image between the first picture and the second picture.

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Patent Owner(s)

Patent OwnerAddress
KABUSHIKI KAISHA TOSHIBA1-1 SHIBAURA 1-CHOME MINATO-KU TOKYO 105-0023

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ohno, Hiroshi Chuo, JP 278 2274
Toya, Kiminori Kawasaki, JP 19 93

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