Light source for spectroscopic analysis, spectroscopic analysis device, and spectroscopic analysis method

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United States of America Patent

PATENT NO 11385173
SERIAL NO

17282780

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Abstract

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[Object] An optimal structure for spectroscopically analyzing a solid-phase or liquid-phase sample in a wavelength range of 1100 to 1200 nm by using supercontinuum light is provided.

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Patent Owner(s)

Patent OwnerAddress
USHIO DENKI KABUSHIKI KAISHA1-6-5 MARUNOUCHI CHIYODA-KU TOKYO 1008150 ?1008150

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Yamada, Go Tokyo, JP 23 128
Yokoyama, Takuma Tokyo, JP 10 15

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Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges12994606101 - 1011 - 2021 - 30010020030040050060070080090010001100120013001400

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