Devices processed using x-rays
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United States of America
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Jun 28, 2022
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N/A
app pub date -
Feb 10, 2020
filing date -
Feb 10, 2020
priority date (Note) -
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status (Latency Note)
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Abstract
In one embodiment, an automated high-speed X-ray inspection tool may emit, by an X-ray source, an X-ray beam to an object of interest with a portion of the X-ray beam penetrating through the object of interest. The automated high-speed X-ray inspection tool may capture, by an X-ray sensor, one or more X-ray images of the object of interest based on the portion of the X-ray beam that penetrates through the object of interest. Each of the X-ray images may be captured with a field of view of at least 12 million pixels.
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