Method for calibrating crystal frequency offset through internal loop of central processing unit
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United States of America Patent
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Jun 7, 2022
Grant Date -
Nov 18, 2021
app pub date -
Oct 31, 2018
filing date -
Dec 12, 2017
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Abstract
The invention provides a method for calibrating crystal frequency offset through an internal loop of a central processing unit (CPU), which comprises: outputting an oscillation exciting signal to a crystal circuit by the CPU; producing a clock signal by the crystal circuit; outputting the clock signal through an output port arranged on the CPU by the internal loop; and adopting and connecting a frequency meter to the output port, and receiving and testing the clock signal to obtain a testing result; determining whether a deviation of the clock signal is qualified; if it is qualified, the tester exits subsequently, otherwise the tester regulates the crystal circuit, and then turning to Step S4. The clock signal of the CPU is output at the output port through the internal loop, and then the frequency meter is used for measuring the clock without being influenced by a probe, and the measurement is more accurate.
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